Jun 4-9, 2017: International Microwave Symposium
IMS-2017 will be held at the Honolulu Convention Center, Honolulu, HI USA. The IEEE MTT International Microwave Symposium (IMS) is the premier annual international meeting for technologists involved in all aspects of microwave theory and practice. It consists of a full week of events, including technical paper presentations, workshops, and tutorials, as well as numerous social events and networking opportunities. The symposium also hosts a large commercial exhibition. Co-located with IMS are the IEEE RFIC and ARFTG conferences.

Attending IMS-2017 will provide an opportunity to discuss your thermal analysis challenges with Microsanj technical personnel at Booth 1751. Microsanj is also presenting a 2-hour workshop, entitled, Analyzing the Thermal Behavior of Advanced Microwave Devices & ICs. The workshop will be held at Room-318A from 10AM to 12PM on Tuesday, June 6. Workshop attendees will gain a greater appreciation of the importance and benefits of the thermoreflectance thermal imaging technique for achieving optimal device performance while ensuring long-term device reliability.
Additionally, Dr. Ali Shakouri will be a keynote speaker at ARFTG presenting, “Thermal Transport in Transistors Based on GaN and Novel 2D Materials.
For additional information and registration information see: http://ims2017.org/ , http://www.rfic-ieee.org/ , or http://www.arftg.org/

May 30-June 2, 2017, ITHERM ECTC2016: Orlando, FL USA 
ITHERM 2017–will be held at the Walt Disney World Swan & Dolphin Hotel, Lake Buena Vista (Orlando), FL USA. Microsanj has co-authored the paper, “Accurate Thermoreflectance Imaging of Nano-Features Using Thermal Decay”. The paper will be presented: WEDNESDAY, MAY 31ST 8:00 – 9:30 AM SESSION E-1: EMERGING MATERIALS & THERMAL PHENOMENON I. For more information and registration see: http://www.ieee-itherm.org


November 8-9, 2016: ISTFA, 42nd International Symposium for Testing and Failure Analysis, Fort Worth Convention Center Fort Worth, TX USA. We will be exhibiting, please come by to meet with us to learn more about thermal imaging based on thermoreflectance. For more information and registration, see: http://www.asminternational.org/web/istfa-2016  

October 23-26, 2016: CSICS, 2016 IEEE Compound Semiconductor IC Symposium, Austin, Texas, USA. Microsanj will be exhibiting at CSICS-2016. Drop to meet with us at Booth 47.
For more information see: http://www.cvent.com/events/2016-ieee-compound-semiconductor-integrated-circuit-symposium-csics-/event-summary-184c0fe480324caa969ef5077746f024.aspx

October 3-7, 2016: EuMA, European Microwave Association, London, UK Microsanj will participate with our partner AMCAD Engineering at booth 116.  Dustin Kendig will give a talk on Monday, Oct 3rd entitled; “Short Pulse Thermal Response of HBTs”
For more information see: http://www.eumweek.com/conferences/eumic.html

October 2-7, 2016 International Workshop on Nitride Semiconductors (IWN 2016)
Microsanj will be exhibiting at IWN 2016. The conference and exhibit will take place at the Hilton Orlando Lake Buena Vista, 1751 Hotel Plaza Blvd, Lake Buena Vista, FL, USA. For more information see: http://www.mrs.org/iwn-2016/

September 21-23, 2016: THERMINIC 2016, 22nd International Workshop, Thermal Investigations of ICs and Systems, Budapest, Hungary. Dr. Andrew Tay will be presenting the paper “Thermal Analysis of Advanced Microelectronic Devices Using Thermoreflectance Thermography” in Session 6, Thursday, 22 Sept.
For more information see: http://www.therminic2016.eu/

August 16-19, 2016: ICEPT 2016, 17th International Conference on Electronic Packaging Technology, Wuhan, China. On Thursday, 18 August, Dr. Andrew Tay will be presenting, “Thermal Imaging Based on Thermoreflectance Addresses the Challenges for Thermal Analysis of Today’s Advanced Complex Devices”.
For more information see: http://www.icept.org/en/

May 31-June 3, 2016, ITHERM ECTC2016: Las Vegas, Nevada, USA (GOLD SPONSOR / Exhibitor / Presentation)

ITHERM 2016–The Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems is at the Cosmopolitan Hotel, Las Vegas, NV, USA (Co-Located with ECTC). Microsanj will present a paper on Wednesday June 1st, 3:55 pm-5:25 pm in Session E2 titled “Thermal Imaging of Nanometer Features”

For more information visit: http://ieee-itherm.org/

May 27, 2016, ARFTG2016: San Francisco, California, USA

87th ARFTG Conference Measurements for Emerging Communications Technologies  – San Francisco, California  at the Mariott Marquis, 780 Mission Street, For more information see: http://arftg.org/index.php/10-future-conferences/31-87th-arftg-conference

May 22-27, 2016 IMS2016: International Microwave Symposium, San Francisco, CA, Exhibitor at Booth 1953 and Presentation

The 2016 IEEE/MTT-S International Microwave Symposium will take place May 24-26, 2016 in San Francisco, CA at the Moscone Center located at 747 Howard St., San Francisco, CA 94103.

IMS2016 will cover developments in microwave technology ranging from nano-devices to system applications. Technical paper sessions, interactive forums, plenary and panel sessions, workshops, short courses, industrial exhibits, and a wide array of other technical activities will be offered at IMS2016.

Dustin Kendig of Microsanj will be presenting the paper, Intrinsic Transient Thermal Response of GaN HEMT” Thursday 13:30 – 13:50 in Session TH3F: Novel and Diverse Measurement Techniques, Location: 308. This IMS-ARFTG session covers a unique set of exciting and contemporary measurement problems. Topics covered include transient thermal analysis, techniques for BIST and production test, and a novel device characterization approach.

At the exhibit, you will have the opportunity meet with Microsanj engineers at booth #1953 to learn more about the Microsanj Thermal Imaging Systems.

For more information on MTT 2016, visit:  http://www.ims2016.org/

May 18, 2016, IEEE CPMT Technical Talk: “Thermal and Diagnostic Challenges with Today’s Electronic Devices”

Speaker: Dustin Kendig, VP Engineering, Microsanj, USA
Organized by: IEEE Singapore Rel/CPMT/ED Chapter and Singapore University of Technology and Design
Time: 10 AM – 11 AM
Venue: Singapore University of Technology and Design, Building 2, Level 4, LT3
Host: Dr. Andrew Tay, andrew_tay@sutd.edu.sg

All are welcome. Registration is not required. For directions see: https://www.google.com.sg/maps/place/Singapore+University+of+Technology+and+Design+(SUTD)/@1.3405005,103.9631207,15z/data=!4m5!3m4!1s0x0:0x7de56b1846994e6c!8m2!3d1.3405005!4d103.9631207

May 16-19, 2016, CS-Mantech: 2016 International Conference on Compound Semiconductor Manufacturing Technology, Hyatt Regency, Miami, FL

Microsanj will be exhibiting, meet with us at Booth 516. On Tuesday evening, May 17th at 6:18 PM, Dr. Mo Shakouri, Microsanj CEO, will present “Nanoscale Thermal Transport Modeling and Characterization”. This presentation will show some of the latest full field transient thermal imaging techniques with submicron spatial and 800 ps time resolution. This capability is used to study temperature non-uniformity in multi finger nanowire gate-allaround MOSFET transistors, in optoelectronic devices, and in high power GaN high electron mobility transistors.

For more information see: http://csmantech.org/

March 20-24, 2016, OFC: The Optical Fiber Communication Conference and Exhibition, Anaheim Convention Center, Anaheim, California, USA,

Microsanj will be at Booth 2835. On Tuesday, 22 March, Dustin Kendig, VP Engineering, will present;
“Device Level Thermal Characterization for Photonics and Power MMICs” in the Expo Theater III at 12:00 noon.
For more information see: http://www.ofcconference.org/en-us/

March 14-17, 2016 Semi Therm 2016: The 32nd annual conference on thermal design, management and
characterization of electronic components and systems, San Jose, California.  http://www.semi-therm.org/